CrushSCI.com
Journal Selection & Manuscript Polishing Services
MICROELECTRONIC ENGINEERING journal cover Engineering
Back to journal directory

Review Cycle Records

MICROELECTRONIC ENGINEERING

Elsevier SCIE Non-OA
2026 Emerging Zone 32025 CAS Zone 32025 JCR Q2
161Average days
196Median days
2Fastest days
323Longest days
822025 publications

Paper Review Records

All Paper Review Records

17 valid samples · Newest publication first
Review days = acceptance date − received date. PDF, DOI, and publisher-page sources are retained.

246 days

Exploring the relationship between doping and Ti-silicidation for advanced FDSOI applications

AuthorsMarie Merlin; Théo Cabaret; Helen Grampeix; Nicolas Gauthier; Mario Ghostine; Joel Kanyandekwe; Philippe Rodriguez; Patrice Gergaud

AffiliationsUniv. Grenoble Alpes, CEA, Leti, 38000, Grenoble, France

Source PDF DOI Publisher page
245 days

From dopant diffusion to optical functionality: A computational study of hyperdoped silicon

AuthorsAlberto Debernardi

AffiliationsCNR-IMM, sede Agrate Brianza, Agrate Brianza, I-20864, Italy

Source PDF DOI Publisher page
53 days

Modelling the ON-state gate leakage current in p-GaN gated AlGaN/GaN HEMTs

AuthorsS. Milazzo; G. Greco; G. Giorgino; C. Miccoli; S. Mirabella; F. Iucolano; F. Roccaforte

AffiliationsConsiglio Nazionale delle Ricerche-Institute for Microelectronics and Microsystems, Catania 95121, Italy; STMicroelectronics, Catania 95121, Italy; Department of Physics and Astronomy “Ettore Majorana”, University of Catania, via Santa Sofia 64, Catania 95123, Italy; CNR-IMM University Unit, via Santa Sofia 64, Catania 95123, Italy

Source PDF DOI Publisher page
44 days

Variability in HfO2-based memristors under pulse operation

AuthorsD. Maldonado; C. Acal; H. Ortiz; F. Navas-Gomez; A. Cantudo; C. Wenger; E. Pérez; J.B. Roldán

AffiliationsDepartamento de Electrónica y Tecnología de Computadores, Universidad de Granada, Facultad de Ciencias, 18071 Granada, Spain; Departamento de Informática y Estadística, Esc. Tec. Sup. de Ingeniería Informática, Universidad Rey Juan Carlos, Móstoles 28933, Madrid, Spain; Departamento de Estadística e Investigación Operativa e Instituto de Matemáticas (IMAG), Universidad de Granada, Facultad de Ciencias, Avd. Fuentenueva s/n, 18071 Granada, Spain; IHP - Leibniz-Institute for High Performance Microelectronics, 15236 Frankfurt (Oder), Germany; Brandenburgische Technische Universität (BTU) Cottbus-Senftenberg, 03046 Cottbus, Germany; Institute Carlos I for Theoretical and Computational Physics, University of Granada, 18071 Granada, Spain

Source PDF DOI Publisher page
229 days

Evaluation of the robustness of the defect-centric model for defect parameter extraction from RTN and BTI analysis using Comphy

AuthorsMartin E.M. Loesener; Tobias Zinsler; Bernhard Stampfer; Florian Wimmer; Eleftherios Ioannidis; Walter Pflanzl; Rainer Minixhofer; Tibor Grasser; Michael Waltl

Affiliationsams-OSRAM AG, Premstätten, Austria; Christian Doppler Laboratory for Single Defect Spectroscopy at the Institute for Microelectronics, TU Wien, Vienna, Austria; Institute for Microelectronics, TU Wien, Vienna, Austria

Source PDF DOI Publisher page
266 days

Simulation of SAF-enhanced multilayered STT-MRAM structures

AuthorsM. Bendra; W. Goes; S. Selberherr; V. Sverdlov

AffiliationsChristian Doppler Laboratory for Nonvolatile Magnetoresistive Memory and Logic at the Institute for Microelectronics, TU Wien, Gußhausstraße 27-29, Wien, A-1040, Austria; Institute for Microelectronics, TU Wien, Gußhausstraße 27-29, Wien, A-1040, Austria; Silvaco Europe Ltd., Compass Point, St Ives, Cambridge, PE27 5JL, United Kingdom

Source PDF DOI Publisher page
246 days

Extensive FPGA and ASIC resource comparison for blind I/Q imbalance estimators and compensators

AuthorsMoritz Tockner; Moritz Stockinger; Oliver Lang; Andreas Meingassner; Mario Huemer

AffiliationsInstitute of Signal Processing, Johannes Kepler University Linz, Altenberger Straße 66, 4040 Linz, Austria; Christian Doppler Laboratory for Digitally Assisted RF Transceivers for Future Mobile Communications, Austria

Source PDF DOI Publisher page

Expert Matching · Case Demo

Turn Your Submission Goalsinto a Verifiable Journal Plan

Share your field, deadline, and author profile. CrushSCI uses real review records to suggest a title direction, shortlist journals, and estimate timelines.

CrushSCI online

Client

I work in environmental engineering and need an SCI paper published within three months. I have no grant funding or prominent co-author. Which journals could I target?

CrushSCI

Yes. We will first screen for feasibility against the 90-day deadline, then identify comparable papers without grant support or prominent co-authors. The final shortlist will prioritize research quality and journal scope.

Suggested title
Machine Learning and Life-Cycle Assessment for Predicting and Optimizing Carbon Emissions in Urban Wastewater Treatment

SampleLatest 5 valid paper samples from 2026

Average review96.4 days

Median77 days

Contact CrushSCI

Contact CrushSCI

Leave your contact details so we can discuss your manuscript, editing needs, and submission plan.

Selected service: Paper Editing Service

Or leave your contact details

WhatsApp, Telegram, WeChat, and email are all optional, but at least one is required. Once received, we will contact you as soon as possible.