Paper Review Records
All Paper Review Records
10 valid samples · Newest publication first
Review days = acceptance date − received date. PDF, DOI, and publisher-page sources are retained.
175
days
Improving Robustness and Variability Tolerance in SRAM-Based In-Memory Computing Using Body Bias
Authors
Neha Gupta; Lomash Chandra Acharya; Khoirom Johnson Singh; Mahipal Dargupally; Abhishek Acharya; S. Dasgupta; Anand BulusuShow moreShow less
Affiliations
1. Indian Institute of Technology Roorkee; 2. Dhanamanjuri University; 3. Sardar Vallabhbhai National Institute of Technology; 4. IIT RoorkeeShow moreShow less
89
days
Leakage Current Suppression in RB-IGCTs through Proton Irradiation: Mechanism and Strategy Design
Authors
Su Yan; chunpin ren; zhitao huang; xiaozhao li; jiapeng liu; xiaoyuan liu; xingchen wang; xiaoguang wei; Bin Gao; jinpeng wu; rong zengShow moreShow less
Affiliations
1. Huairou Laboratory; 2. Tsinghua UniversityShow moreShow less
100
days
Impact of CMP surface quality and pre-epitaxial H 2 treatment on the surface defect mitigation and electrical characteristics of 6.5 kV SiC MOSFET
Authors
Chi-Hsiang Hsieh; Chiao-Yang Cheng; Yi-Kai Hsiao; Tzu-Yi Lee; Yi-Chang Wu; Yan-Kuin Su; Chao-Chang A Chen; Po-Tsung Lee; Hao-Chung KuoShow moreShow less
Affiliations
1. Institute of Electro-Optical Engineering, College of Electrical and Computer Engineering, National Yang Ming Chiao Tung University; 2. Academy of Innovative Semiconductor and Sustainable Manufacturing, National Cheng Kung University; 3. Semiconductor Research Center, Hon Hai Research Institute; 4. GeChi Compound Semiconductor Co. Ltd; 5. National Taiwan University of Science and Technology; 6. Chung Yuan Christian UniversityShow moreShow less
125
days
High-speed, self-powered and polarization-sensitive photodetector based on FePSe 3 /ReS 2 heterojunction
Authors
Yanliang Zhu; Yunfei Wang; Xingyu Zhou; Keyu Qian; Yujin He; Yike Li; Haiyan Nan; Shaoqing Xiao; Zhengjin WengShow moreShow less
Affiliations
1. Jiangnan UniversityShow moreShow less
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