Paper Review Records
All Paper Review Records
25 valid samples · Newest publication first
Review days = acceptance date − received date. PDF, DOI, and publisher-page sources are retained.
441
days
Single OTRA based multifunction inverse filter
Authors
Subhasish Banerjee; Pulak Mondal; Mourina Ghosh; Rajeev Kumar RanjanShow moreShow less
Affiliations
1. Department of Electronics & Communication Engineering, MCKV Institute of Engineering, Liluah, Howrah , India; 2. Institute of Radio Physics and Electronics, University of Calcutta, Kolkata, India; 3. Department of Electronics & Communication Engineering, Indian Institute of Information Technology, Guwahati, India; 4. Department of Electronics Engineering, Indian Institute of Technology (Indian School of Mines), Dhanbad, IndiaShow moreShow less
482
days
Comparative analysis of noise effects on triple, double, and single material gate step FinFET
Authors
Rinku Rani Das; Atanu Chowdhury; Apurba ChakrabortyShow moreShow less
Affiliations
1. School of Computing, Amrita Vishwa Vidyapeetham, Amritapuri, Kollam, India; 2. Department of Electronics and Communication Engineering, National Institute of Technology Agartala, Tripura, India; 3. Department of Electrical and Electronics Engineering, Birla Institute of Technology and Science Pilani, Goa, IndiaShow moreShow less
164
days
Electron radiation-induced device degradation in commercial SiC Power MOSFETs
Authors
Tamana Baba; Fatihah Assyira bt Mohd Bakri; Abdullah Üzüm; Mehmet Turhal; Norazlina Saidin; Nurul Fadzlin HasbullahShow moreShow less
Affiliations
1. Department of Electrical and Computer Engineering, Kulliyyah of Engineering, International Islamic University Malaysia, Kuala Lumpur, Malaysia; 2. Department of Electrical and Electronics Engineering, Faculty of Engineering, Karadeniz Technical University, Trabzon, TürkiyeShow moreShow less
72
days
The role of asymmetry in elevating nanosheet FET: RF and circuit metrics
Authors
Raj Saha; Anubhab Saha; Akash Mandal; Tridib Kar; Subir Kumar Maity; Udai P. Singh; Rajendra PrasadShow moreShow less
Affiliations
1. School of Electronics Engineering, Kalinga Institute of Industrial Technology (KIIT) Deemed to be University, Bhubaneswar, IndiaShow moreShow less
88
days
Unveiling the impact of ITCs on High-k SOI GaN FinFET and its sensitivity analysis for improved reliability: a simulation study
Authors
Vandana Singh Rajawat; Bharat Choudhary; Ajay KumarShow moreShow less
Affiliations
1. Department of Electronics & Communication Engineering, Malaviya National Institute of Technology, Jaipur, India; 2. Department of Electronics & Communication Engineering, Jaypee Institute of Information Technology, Noida, IndiaShow moreShow less
594
days
A 4.9 GS/s strongarm latch comparator topology with offset correction in 32-nm
Authors
Chokkakula Ganesh; A. Murali; B. Vamsy Krishna; T. Ananda Babu; Girraj Sharma; Asisa Kumar Panigrahy; M. Durga PrakashShow moreShow less
Affiliations
1. Deptartment of Electronics and Communication Engineering, VNR Vignana Jyothi Institute of Engineering and Technology, Hyderabad, India; 2. Deptartment of Electronics and Communication Engineering, QIS College of Engineering and Technology, Ongole, Vengamukkapalem, India; 3. Department of Electronics and Communication Engineering, Seshadri Rao Gudlavalleru Engineering College, Andhra Pradesh, India; 4. Jindal Institute of Behavioural Sciences O.P. Jindal Global University, Sonipat, India; 5. Dept. of Electronics and Communication Engineering, Faculty of Science and Technology (IcfaiTech), ICFAI Foundation for Higher Education Hyderabad, Hyderabad, India; 6. Department of ECE, School of Engineering and Science, SRM University-AP, Mangalagiri, Andhra Pradesh, IndiaShow moreShow less
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