Paper Review Records
All Paper Review Records
18 valid samples · Newest publication first
Review days = acceptance date − received date. PDF, DOI, and publisher-page sources are retained.
62
days
Accelerated electro-thermo-mechanical co-simulation of power modules using reduced-order modeling and neural network-based field reconstruction
AuthorsCélestin Ott; Gaëtan Perez; Pierre Perichon; Raphaël Morvillier; Romain Gwoziecki
AffiliationsUniversité Grenoble Alpes, CEA, Leti, F-38000 Grenoble, France
60
days
Innovative FA hardware solution to enable system-level debug of 3D ICs
AuthorsLesly Endrinal; Jehan Saujauddin; YuanChung Ho; Dilbagh Singh; Sasi Sekaran Sundaresan; Vinod Kumar Kakumanu; Jessen Gonzalez; Willem D. van Driel; G.Q. Zhang
AffiliationsGoogle LLC, 6420 Sequence Drive, San Diego, CA, 92126, United States of America; Google LLC, 2015 Stierlin Ct, Mountain View, CA, 94043, United States of America; Department of Microelectronics, Delft University of Technology, the Netherlands
181
days
Modeling moisture effects on Time-Dependent Dielectric Breakdown in galvanic isolators based on polymeric dielectrics
AuthorsJurij L. Mazzola; Gabriele L. Scarpiello; Matteo Greatti; Tarundeep Singh; Francesco Guzzi; Fabrizio Speroni; Marco Salina; Donata Asnaghi; Michele Lauria; Dario Paci; Vincenzo Marano; Alessandro S. Spinelli; Christian Monzio Compagnoni; Gerardo Malavena
AffiliationsDipartimento di Elettronica, Informazione e Bioingegneria, via Golgi 42, 20133, Milano, Italy; STMicroelectronics, via Tolomeo 1, 20007, Cornaredo (MI), Italy; STMicroelectronics, via Camillo Olivetti 2, 20864, Agrate Brianza (MI), Italy
95
days
Investigation of degradations in p-GaN gate power HEMTs after power cycling test
AuthorsTaehyeon Kim; Kinam Song; Kihyun Kim; Inho Kang
AffiliationsPower SoC Center, Korea Electrotechnology Research Institute (KERI), Changwon, Republic of Korea
176
days
Lifetime evaluation of wire bonds in LED systems by modeling and accelerated testing
AuthorsT. Walter; G. Khatibi; L.A. Sánchez López; M. Hartleb; M. Li; S. Listl
AffiliationsInstitute of Chemical Technologies and Analytics, TU Wien, Getreidemarkt 9/164, 1060, Vienna, Austria; ams-OSRAM International GmbH, Leibnitzstraße 4, 93055, Regensburg, Germany
58
days
GaN Super-Lattice Castellated Field Effect Transistors (SLCFETs): Stacked channel structure creates three parallel devices
AuthorsBazila Parvez; Matthew D. Smith; James W. Pomeroy; Justin Parke; Robert S. Howell; Martin Kuball
AffiliationsCenter for Device Thermography and Reliability (CDTR), University of Bristol, Bristol, BS8 1TL, United Kingdom; Northrop Grumman Mission Systems, Linthicum, MD, 21090, USA
110
days
Effect of addition carbon nanotubes (MWCNTs) on the microstructure, mechanical properties and wetting of nanocomposites Sn-Bi/MWCNTs solder alloys
AuthorsWoddley Taffarel Amancio da Silva; Judá Izel Silva; Nayra Reis do Nascimento; Gabriel Fabricio Rocha de Carvalho Padua; Joaquim Souza de Oliveira; Julio Simonetti Martins Junior; Luciano de Souza Sahdo; Ricardo da Silva Barboza; Antônio Cláudio Kieling; Alessandro Stone da Silva; José Costa de Macêdo Neto
AffiliationsDepartamento de Engenharia de Materiais, Escola Superior de Tecnologia, Universidade do Estado do Amazonas (UEA), Av. Darcy Vargas, 1200, Parque 10 de Novembro, Manaus, AM, Brazil; Instituto de Desenvolvimento Tecnológico (INDT), Av. José Moacir Teberga de Toledo, 1520 - Planalto, Manaus, AM, Brazil; Departamento de Engenharia da Computação, Escola Superior de Tecnologia, Universidade do Estado do Amazonas (UEA), Av. Darcy Vargas, 1200, Parque 10 de Novembro, Manaus, AM, Brazil; Departamento de Engenharia Mecânica, Escola Superior de Tecnologia, Universidade do Estado do Amazonas (UEA), Av. Darcy Vargas, 1200, Parque 10 de Novembro, Manaus, AM, Brazil; Conecthus Instituto de Tecnologia e Biotecnologia do Amazonas, Manaus, 69075-000, AM, Brazil; Callidus, Avenida dos Oitis, n° 2449, Bloco - Armando Mendes, no Distrito Industrial, com, CEP 69089-035, Manaus, Amazonas, Brazil
76
days
Random-vibration fatigue life of plated through-hole components on circulator pump PCBs: Experiments, model fidelity and spectral damage methods
AuthorsHiren Patel; Sergey Sorokin; Kim Martin Nielsen
AffiliationsAalborg University, Aalborg, Denmark; Grundfos Holding A/S, Denmark
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SampleLatest 5 valid paper samples from 2026
Average review96.4 days
Median77 days