CrushSCI.com
Journal Selection & Manuscript Polishing Services
ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING journal cover Engineering
Back to journal directory

Review Cycle Records

ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING

Springer SCIE Non-OA
2026 Emerging Zone 42025 CAS Zone 42025 JCR Q4
247.7Average days
191.5Median days
72Fastest days
594Longest days
2452025 publications

Paper Review Records

All Paper Review Records

20 valid samples · Newest publication first
Review days = acceptance date − received date. PDF, DOI, and publisher-page sources are retained.

188 days

Reconfiguring FINFET SRAM for next-generation AI robotics: a review

AuthorsTamilarasi Raja

Affiliations1. Department of Electronics and Communication and Engineering, Bannari Amman Institute of Technology, Sathyamangalam, Erode, India

Source PDF DOI Publisher page
296 days

A low-voltage and low-power gm-C low-pass filter with tunable cut-off frequency suitable for a wide range of biomedical applications

AuthorsAli Jalili; Soolmaz Abbasalizadeh; Mohsen Javadi

Affiliations1. Department of Electrical and Biomedical Engineering, Mazandaran University of Science and Technology, Babol, Iran, Babol, Iran; 2. Department of Electrical Engineering, Faculty of Engineering and Technology, University of Mazandaran, Babolsar, Iran, Babolsar, Iran

Source PDF DOI Publisher page
340 days

Analog computation model using second generation voltage conveyors: numerical analysis

AuthorsAnkit Kumar Gaur; Manish Verma; Dhandapani Vaithiyanathan

Affiliations1. Department of Electronics and Communication Engineering, National Institute of Technology Delhi, New Delhi-110036, India

Source PDF DOI Publisher page
343 days

Low-power RF down-conversion mixer design for emerging applications: review, analysis and technical recommendations

AuthorsRaja Mahmou

Affiliations1. Laboratory of Electrical Systems, Energy Efficiency, and Telecommunications (LSEEET), Cadi Ayyad University, Marrakesh, Morocco; 2. Laboratory of Engineering Sciences and Techniques (LABSTI), Private University of Marrakech (UPM), Marrakech, Morocco

Source PDF DOI Publisher page
253 days

A hybrid channel-spatial attention mechanism in capsule networks for histopathology analysis

AuthorsB. Syambabu; V. D. Ambeth Kumar; V. D. Ashok Kumar

Affiliations1. Department Computer Engineering, Research Scholar, Mizoram University, Aizawl, India; 2. Department Computer Engineering, Mizoram University, Aizawl, India; 3. Department Computer Science and Engineering, Loyola Institute of Technology, Tamil Nadu, Kuthambakkam, India

Source PDF DOI Publisher page
170 days

Design and FPGA implementation of reversible vedic multipliy and accumulate unit for cryptography applications

AuthorsV. Thamizharasan; A. Nikhil; M. Vigneshwara; B. Mahesh Bala; S. Vasantha Kumar

Affiliations1. Department of Electronics and Communication Engineering, Erode Sengunthar Engineering College, Erode, India

Source PDF DOI Publisher page
135 days

Design and implementation of power management integrated circuit for next-generation SoCs with energy optimization and thermal protection in SCL-180 nm CMOS technology

AuthorsBapuji Banothu; Venkata Krishna Odugu; Harish Babu Gade

Affiliations1. Department of ECE, CVR College of Engineering, Hyderabad, India

Source PDF DOI Publisher page
441 days

Single OTRA based multifunction inverse filter

AuthorsSubhasish Banerjee; Pulak Mondal; Mourina Ghosh; Rajeev Kumar Ranjan

Affiliations1. Department of Electronics & Communication Engineering, MCKV Institute of Engineering, Liluah, Howrah , India; 2. Institute of Radio Physics and Electronics, University of Calcutta, Kolkata, India; 3. Department of Electronics & Communication Engineering, Indian Institute of Information Technology, Guwahati, India; 4. Department of Electronics Engineering, Indian Institute of Technology (Indian School of Mines), Dhanbad, India

Source PDF DOI Publisher page
482 days

Comparative analysis of noise effects on triple, double, and single material gate step FinFET

AuthorsRinku Rani Das; Atanu Chowdhury; Apurba Chakraborty

Affiliations1. School of Computing, Amrita Vishwa Vidyapeetham, Amritapuri, Kollam, India; 2. Department of Electronics and Communication Engineering, National Institute of Technology Agartala, Tripura, India; 3. Department of Electrical and Electronics Engineering, Birla Institute of Technology and Science Pilani, Goa, India

Source PDF DOI Publisher page
164 days

Electron radiation-induced device degradation in commercial SiC Power MOSFETs

AuthorsTamana Baba; Fatihah Assyira bt Mohd Bakri; Abdullah Üzüm; Mehmet Turhal; Norazlina Saidin; Nurul Fadzlin Hasbullah

Affiliations1. Department of Electrical and Computer Engineering, Kulliyyah of Engineering, International Islamic University Malaysia, Kuala Lumpur, Malaysia; 2. Department of Electrical and Electronics Engineering, Faculty of Engineering, Karadeniz Technical University, Trabzon, Türkiye

Source PDF DOI Publisher page

Expert Matching · Case Demo

Turn Your Submission Goalsinto a Verifiable Journal Plan

Share your field, deadline, and author profile. CrushSCI uses real review records to suggest a title direction, shortlist journals, and estimate timelines.

CrushSCI online

Client

I work in environmental engineering and need an SCI paper published within three months. I have no grant funding or prominent co-author. Which journals could I target?

CrushSCI

Yes. We will first screen for feasibility against the 90-day deadline, then identify comparable papers without grant support or prominent co-authors. The final shortlist will prioritize research quality and journal scope.

Suggested title
Machine Learning and Life-Cycle Assessment for Predicting and Optimizing Carbon Emissions in Urban Wastewater Treatment

SampleLatest 5 valid paper samples from 2026

Average review96.4 days

Median77 days

Contact CrushSCI

Contact CrushSCI

Leave your contact details so we can discuss your manuscript, editing needs, and submission plan.

Selected service: Paper Editing Service

Or leave your contact details

WhatsApp, Telegram, WeChat, and email are all optional, but at least one is required. Once received, we will contact you as soon as possible.