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Computer Science
Computer Science
Paper Review Records
All Paper Review Records
11 valid samples · Newest publication first
Review days = acceptance date − received date. PDF, DOI, and publisher-page sources are retained.
337
days
Point cloud registration for non-destructive, high-resolution coating thickness measurement from 3D scans
AuthorsSimon Duenser; Ivo Aschwanden; Raamadaas Krishnadas; Majid Nabavi; Markus Bambach
AffiliationsETH Zurich, Advanced Manufacturing Laboratory, Technoparkstrasse 1, 8005 Zurich, Switzerland; ETH Zurich, Automatic Control Laboratory, Physikstrasse 3, 8092 Zurich, Switzerland; Inspire AG, Technoparkstrasse 1, 8005 Zurich, Switzerland; Oerlikon Metco AG, Rigackerstrasse 16, 5610 Wohlen, Switzerland
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