Paper Review Records
All Paper Review Records
3 valid samples · Newest publication first
Review days = acceptance date − received date. PDF, DOI, and publisher-page sources are retained.
Data Pattern Dependence of SEU Cross Sections of 12-nm FinFET Flip-Flops
AuthorsJiesi Xing; Christopher J. Elash; Dylan Lambert; Harris Lu; Shi-Jie Wen; Rita Fung; Li Chen
Affiliations1. University of Saskatchewan; 2. Cisco Systems
Total Ionizing Dose Effects on a PbS-CQD-Based CMOS Direct-Conversion X-Ray Image Sensor
AuthorsChun-Min Zhang; Alexandre Neyret; Vincent Goossens; Riccardo Quaglia; Vincent Goiffon; Artem Shulga; Pierre-Francois Ruedi
Affiliations1. Centre Suisse d’Electronique et de Microtechnique (CSEM); 2. DEOS/CIMI, ISAE-Supaero; 3. QDI Systems
Comparing Thermal Neutron Scintillators for Use With SiPM-Readout Detectors
AuthorsA. Moustafa; E. Hoegberg; E. Lukosi; M. Loyd
Affiliations1. Oak Ridge National Laboratory; 2. University of Tennessee
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