Paper Review Records
All Paper Review Records
10 valid samples · Newest publication first
Review days = acceptance date − received date. PDF, DOI, and publisher-page sources are retained.
59
days
Contrasting effects of conductive carbon coating on sulfur valence changes in glass during S K-edge XAFS and laboratory WD-XRF analysis
Authors
Yoshitaka Saijo; Hiroyuki HijiyaShow moreShow less
Affiliations
Innovative Technology Laboratories, AGC Inc., 1-1 Suehiro-cho, Tsurumi-ku, Yokohama 230-0045, Japan; Materials Integration Laboratories, AGC Inc., 1-1 Suehiro-cho, Tsurumi-ku, Yokohama 230-0045, JapanShow moreShow less
65
days
Spectral-acoustic data fusion combined with transfer learning for quantitative LIBS analysis of deep-sea cobalt-rich crusts
Authors
Zuohe Shi; Ye Tian; Pingsai Chu; Qingxi Liu; Yuanyuan Xue; Zhen Liu; Jinjia Guo; Yuan Lu; Ronger ZhengShow moreShow less
Affiliations
College of Physics and Optoelectronic Engineering, Ocean University of China, Qingdao 266100, China; Engineering Research Center of Advanced Marine Physical Instruments and Equipment of Education Ministry, Ocean University of China, Qingdao 266100, China; Investigation Department, National Deep Sea Center (NDSC), Qingdao 266237, ChinaShow moreShow less
67
days
Quantitative μ-SRXRF mapping of Mn and Fe in moss leaflets using Compton-based thickness correction
Authors
Matthias Weinberger; Luigi Schillaci; Christoph Rumancev; Thomas Bretschneider; Jan Garrevoet; Axel Rosenhahn; Ingeborg Lang; Helga LichteneggerShow moreShow less
Affiliations
Institute of Physics and Materials Science, BOKU University, 1190 Vienna, Austria; Department of Functional and Evolutionary Ecology, University of Vienna, 1030 Vienna, Austria; Faculty of Chemistry and Biochemistry, Ruhr-University Bochum, 44780 Bochum, Germany; Deutsches Elektronen-Synchrotron DESY, 22607 Hamburg, GermanyShow moreShow less
63
days
A simple reagent-based method for the determination of total dissolved inorganic carbon in seawater and atmospheric CO2 via stoichiometric SrCO3 formation and ICP-OES detection
Authors
Tomohiro NarukawaShow moreShow less
Affiliations
National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, JapanShow moreShow less
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