Paper Review Records
All Paper Review Records
23 valid samples · Newest publication first
Review days = acceptance date − received date. PDF, DOI, and publisher-page sources are retained.
95
days
Investigation of degradations in p-GaN gate power HEMTs after power cycling test
Authors
Taehyeon Kim; Kinam Song; Kihyun Kim; Inho KangShow moreShow less
Affiliations
Power SoC Center, Korea Electrotechnology Research Institute (KERI), Changwon, Republic of KoreaShow moreShow less
176
days
Lifetime evaluation of wire bonds in LED systems by modeling and accelerated testing
Authors
T. Walter; G. Khatibi; L.A. Sánchez López; M. Hartleb; M. Li; S. ListlShow moreShow less
Affiliations
Institute of Chemical Technologies and Analytics, TU Wien, Getreidemarkt 9/164, 1060, Vienna, Austria; ams-OSRAM International GmbH, Leibnitzstraße 4, 93055, Regensburg, GermanyShow moreShow less
58
days
GaN Super-Lattice Castellated Field Effect Transistors (SLCFETs): Stacked channel structure creates three parallel devices
Authors
Bazila Parvez; Matthew D. Smith; James W. Pomeroy; Justin Parke; Robert S. Howell; Martin KuballShow moreShow less
Affiliations
Center for Device Thermography and Reliability (CDTR), University of Bristol, Bristol, BS8 1TL, United Kingdom; Northrop Grumman Mission Systems, Linthicum, MD, 21090, USAShow moreShow less
110
days
Effect of addition carbon nanotubes (MWCNTs) on the microstructure, mechanical properties and wetting of nanocomposites Sn-Bi/MWCNTs solder alloys
Authors
Woddley Taffarel Amancio da Silva; Judá Izel Silva; Nayra Reis do Nascimento; Gabriel Fabricio Rocha de Carvalho Padua; Joaquim Souza de Oliveira; Julio Simonetti Martins Junior; Luciano de Souza Sahdo; Ricardo da Silva Barboza; Antônio Cláudio Kieling; Alessandro Stone da Silva; José Costa de Macêdo NetoShow moreShow less
Affiliations
Departamento de Engenharia de Materiais, Escola Superior de Tecnologia, Universidade do Estado do Amazonas (UEA), Av. Darcy Vargas, 1200, Parque 10 de Novembro, Manaus, AM, Brazil; Instituto de Desenvolvimento Tecnológico (INDT), Av. José Moacir Teberga de Toledo, 1520 - Planalto, Manaus, AM, Brazil; Departamento de Engenharia da Computação, Escola Superior de Tecnologia, Universidade do Estado do Amazonas (UEA), Av. Darcy Vargas, 1200, Parque 10 de Novembro, Manaus, AM, Brazil; Departamento de Engenharia Mecânica, Escola Superior de Tecnologia, Universidade do Estado do Amazonas (UEA), Av. Darcy Vargas, 1200, Parque 10 de Novembro, Manaus, AM, Brazil; Conecthus Instituto de Tecnologia e Biotecnologia do Amazonas, Manaus, 69075-000, AM, Brazil; Callidus, Avenida dos Oitis, n° 2449, Bloco - Armando Mendes, no Distrito Industrial, com, CEP 69089-035, Manaus, Amazonas, BrazilShow moreShow less
76
days
Random-vibration fatigue life of plated through-hole components on circulator pump PCBs: Experiments, model fidelity and spectral damage methods
Authors
Hiren Patel; Sergey Sorokin; Kim Martin NielsenShow moreShow less
Affiliations
Aalborg University, Aalborg, Denmark; Grundfos Holding A/S, DenmarkShow moreShow less
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