CrushSCI.com
201.3Average days
167.5Median days
108Fastest days
685Longest days
492025 publications

Paper Review Records

All Paper Review Records

20 valid samples · Newest publication first
Review days = acceptance date − received date. PDF, DOI, and publisher-page sources are retained.

154 days

Hardware-aware decision tree ensembles for radar data processing on the edge with online learning support

Authors
Rodrigo Olmos; Daniel Vázquez; Sergio Hernandez; Pedro Lobo; Eduardo Casanueva; Andrés OteroShow moreShow less
Affiliations
Centro de Electrónica Industrial y Sistemas Multimodales (CEIMM), Universidad Politécnica de Madrid (UPM), Madrid, Spain; Indra, Madrid, SpainShow moreShow less
Source PDF DOI Publisher page
152 days

Exploiting spatial and temporal consistency for fault detection in semantic segmentation NN for indoor and outdoor exploration

Authors
Lorenzo Fezza; Antonio Porsia; Annachiara Ruospo; Ernesto Sanchez; Matteo Sonza Reorda; Vittorio TurcoShow moreShow less
Affiliations
DAUIN, Politecnico di Torino, ItalyShow moreShow less
Source PDF DOI Publisher page
152 days

A hardware context monitoring for testing complex dynamic SRAM faults in digital test environment

Authors
Dorian Ronga; Eric Faehn; Patrick Girard; Arnaud VirazelShow moreShow less
Affiliations
LIRMM - University of Montpellier/CNRS , Montpellier, France; STMicroelectronics, Crolles, FranceShow moreShow less
Source PDF DOI Publisher page
152 days

Mapping and detecting exploitable voltage glitches using clock traces and neural networks

Authors
Asier Gambra; Durba Chatterjee; Unai Rioja; Igor Armendariz; Lejla BatinaShow moreShow less
Affiliations
Radboud University, Houtlaan 4, 6525 XZ Nijmegen, The Netherlands; Ikerlan Research Center, P°JM Arizmendiarrieta 2, Arrasate/Mondragon, Basque Country 20500, SpainShow moreShow less
Source PDF DOI Publisher page
138 days

Liftoff: Verification of digital designs in Scala

Authors
Tjark Petersen; Luca Pezzarossa; Martin SchoeberlShow moreShow less
Affiliations
Department of Applied Mathematics and Computer Science, Technical University of Denmark, Kongens Lyngby, DenmarkShow moreShow less
Source PDF DOI Publisher page
142 days

Wafer map pattern recognition using ternary spiking neural networks

Authors
Abhishek Kumar Mishra; Anup Das; Nagarajan KandasamyShow moreShow less
Affiliations
Department of Electrical and Computer Engineering, Drexel University, Philadelphia, PA, USAShow moreShow less
Source PDF DOI Publisher page

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I work in environmental engineering and need an SCI paper published within three months. I have no grant funding or prominent co-author. Which journals could I target?

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Suggested title
Machine Learning and Life-Cycle Assessment for Predicting and Optimizing Carbon Emissions in Urban Wastewater Treatment

SampleLatest 5 valid paper samples from 2026

Average review62 days

Median65 days

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