Paper Review Records
All Paper Review Records
23 valid samples · Newest publication first
Review days = acceptance date − received date. PDF, DOI, and publisher-page sources are retained.
68
days
Enhancement of decrypted images degraded by ciphertext cropping
Authors
Guidong Zhang; Chenling Yu; Kehua Huo; Shouliang LiShow moreShow less
Affiliations
1. School of Information Science and Engineering, Lanzhou University, Lanzhou, ChinaShow moreShow less
60
days
AFGM-SORT: Adaptive feature fusion and global matching for robust multi-object tracking
Authors
Furong Peng; Ning Wang; Linjun Wu; Zhen PengShow moreShow less
Affiliations
1. College of Information Science and Engineering, Hunan Institute of Engineering, Hunan Province, ChinaShow moreShow less
72
days
A web-enabled real-time multimodal emotion detection system integrating BERT text embeddings and CNN-based speech and facial models
Authors
Sreeja Kamera; Dhanusha Challa; Hannah Bwalya; D. Ramesh Reddy; Prakash KodaliShow moreShow less
Affiliations
1. Department of ECE, NIT Warangal, Warangal, India; 2. Department of ECE, VNR VJIET, Hyderabad, IndiaShow moreShow less
95
days
DS-WaveGNN: a Dual-path wavelet graph neural network for fundus image classification
Authors
Hailong Ma; Haiyang Wang; Pujie JingShow moreShow less
Affiliations
1. School of Computer, North China Institute of Aerospace Engineering, Langfang, ChinaShow moreShow less
106
days
A prompt-robust vision-language detector for accurate UAV inventory inspection in power-material warehouses
Authors
Yuefeng Chen; Qiliang Du; Lianfang TianShow moreShow less
Affiliations
1. School of Automation Science and Engineering, South China University of Technology, GuangZhou, China; 2. Sino-Singapore International Joint Research Institute, GuangZhou, China; 3. Guangdong Engineering Research Center of Cloud-Edge-End Collaboration Technology for Smart City, GuangZhou, ChinaShow moreShow less
106
days
Dual-layer secure block mapping: a hybrid approach to image tamper detection and high-fidelity recovery
Authors
Akshay Tiwari; Aryan Kanojia; Anshit Gadi; Lavi TanwarShow moreShow less
Affiliations
1. Dept. of Electronics and Communication Engineering, Delhi Technological University, Delhi, IndiaShow moreShow less
Expert Matching · Case Demo
Turn Your Submission Goalsinto a Verifiable Journal Plan
Share your field, deadline, and author profile. CrushSCI uses real review records to suggest a title direction, shortlist journals, and estimate timelines.
