Paper Review Records
All Paper Review Records
11 valid samples · Newest publication first
Review days = acceptance date − received date. PDF, DOI, and publisher-page sources are retained.
103
days
Computational Study of the Electronic, Optical, and Mechanical Properties of InCuX 2 (X = S, Se, Te) via Ab Initio Methods
Authors
Nilufer Yesmin Tanisa; Md Jahid Hossain Bhuiyan; M. RahmanShow moreShow less
Affiliations
1. Uttara University; 2. Jahangirnagar University; 3. Comilla University; 4. Bangladesh Atomic Energy CommissionShow moreShow less
147
days
Acoustic Phonon Wave Attenuation in One‐Dimensional Antiferromagnet: Effects of DM Interaction on Magnon‐Phonon Coupling Factor
Authors
Erna Leticia Tchinda Ngounou; Blaise Ndakom; Adrien Yvan Nouboudem Tchinda; Engelberg Afuoti Ngwa; Georges Collince Fouokeng; Nadjitonon Ngarmaim; A. Kenfack-JiotsaShow moreShow less
Affiliations
1. Université de Yaoundé I; 2. Université de Dschang; 3. University of DoualaShow moreShow less
190
days
Semiconducting and Optomechanical Insights Into Rare‐Earth Copper Oxy‐Sulfates for Advanced Energy Technologies
Authors
Ahmad Hussain; Nawishta Jabeen; Ali Yaqoob; Omer Musa; Muhammad Touqeer Khan; Aseel SmeratShow moreShow less
Affiliations
1. University of Lahore; 2. Fatima Jinnah Women University; 3. Omdurman Islamic University; 4. Al-Ahliyya Amman UniversityShow moreShow less
182
days
Electronic Structures of Framework‐Substituted Type‐I Tin Clathrate Semiconductors
Authors
Dong Xue; Yanbin DENG; Charles W. MylesShow moreShow less
Affiliations
1. Langfang Normal University; 2. Shangrao Normal University; 3. Texas Tech UniversityShow moreShow less
191
days
Towards Rare‐Earth‐Doped Optoelectronics: GGA+U Analysis of Eu 3+ ‐Doped ZnO Nanomaterials
Authors
Shahriar Haque Badhan; Md. Rasidul Islam; Md. Rasidul Islam; Bushra Anam; Md. Al-Amin Bhuiyan Shuvo; Md Rifatul Islam; Md Rifatul IslamShow moreShow less
Affiliations
1. Khulna University of Engineering and Technology; 2. Lamar University; 3. Jamalpur Science and Technology UniversityShow moreShow less
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