Paper Review Records
All Paper Review Records
10 valid samples · Newest publication first
Review days = acceptance date − received date. PDF, DOI, and publisher-page sources are retained.
Noise correlation and phase resolution in off-axis electron holography
AuthorsLuyang Wang; Ye Luo; Xiaowen Chen; Xiaoyu Wang; Wen Shi; Jan Caron; Thibaud Denneulin; Rafal E. Dunin-Borkowski; Fengshan Zheng
AffiliationsCenter for Electron Microscopy, South China University of Technology, Guangzhou 511442, China; Spin-X Institute, School of Physics and Optoelectronics, Guangdong-Hong Kong-Macao Joint Laboratory of Optoelectronic and Magnetic Functional Materials, State Key Laboratory of Luminescent Materials and Devices, South China University of Technology, Guangzhou 511442, China; School of Future Technology, South China University of Technology, Guangzhou 511442, China; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich, 52425 Jülich, Germany
A variational method based post-processing framework for high-fidelity EBSD grain-detection refinement
AuthorsXu Zhang; Haitao Zhao; Junheng Gao; Honghui Wu; Chaolei Zhang; Yuhe Huang; Jun Lu; Shuize Wang; Xinping Mao
AffiliationsInstitute for Carbon Neutrality, University of Science and Technology Beijing, Beijing 100083, China; Institute for Steel Sustainable Technology, Liaoning Academy of Materials, Shenyang 110004, China
On the accuracy of atomic-resolution electrostatic measurements in 2D materials
AuthorsRafael V. Ferreira; Sebastian Calderon V․; Paulo J. Ferreira
AffiliationsINL – International Iberian Nanotechnology Laboratory, Av. Mestre José Veiga s/n, Braga, 4715-330, Portugal; Mechanical Engineering Department and IDMEC, Instituto Superior Técnico, University of Lisbon, Av. Rovisco Pais, Lisboa, 1049-001, Portugal; Departamento de Física de Materiales, Universidad Complutense de Madrid, Pl. de las Ciencias 1, Madrid, 28040, Spain; Instituto Pluridisciplinar, Universidad Complutense de Madrid, P. de Juan XXIII 1, Madrid, 28040, Spain; Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, 15213, PA, USA
Overcoming physical approximation limitations of nanometal thin film thickness measurement by physics-informed neural networks
AuthorsWenjie Feng; Yuxin Zhang; Yu Zhang; Yongning He
AffiliationsShaanxi Provincial Key Laboratory of Electronic Devices and Advanced Chips, Xi'an Key Laboratory of Micro-Nano Electronics and System Integration, and School of Microelectronic, Xi'an Jiaotong University, Xi'an, 710049, China
Impact of air damping in quantitative dynamic AFM-measurements
AuthorsIlya A. Morozov
AffiliationsInstitute of Continuous Media Mechanics UB RAS, Academika Koroleva st. 1, 614013, Perm, Russia
Preserving spatial and energy resolution in multi-dimensional hyperspectral image datasets via rigid image registration
AuthorsYifeng Huang; Xingxu Yan; Toshihiro Aoki; Xiaoqing Pan
AffiliationsDepartment of Physics and Astronomy, University of California, Irvine, CA 92697, USA; Department of Materials Science and Engineering, University of California, Irvine, CA 92697, USA; Irvine Materials Research Institute, University of California, Irvine, CA 92697, USA
Electron-optical systems with a cathode lens in telescopic mode
AuthorsA.A. Trubitsyn; E. Yu․ Grachev; E.G. Kochergin
AffiliationsRyazan State Radio Engineering University named after V.F. Utkin, Gagarina st. 59/1, Ryazan, 390005, Russia
Using stretching–modulation–compression effect to generate isolated few-femtosecond MeV electron bunches
AuthorsCheng-Ying Tsai; Weilun Qin; Jiapeng Li; Qiao Luo; Xiaofan Wang
AffiliationsSchool of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, 430074, China; Institute of High Energy Physics, Chinese Academy of Sciences, Beijing, 100049, China; Spallation Neutron Source Science Center, Dongguan, 523803, China; Institute of Advanced Light Source Facilities, Shenzhen, 518107, China
Drift correction of scan images by snapshot referencing
AuthorsZac Thollar; Kanto Maeda; Tetsuya Kubota; Taka-aki Yano; Qiwen Tan; Takumi Sannomiya
AffiliationsDepartment of Materials Science and Engineering, School of Materials and Chemical Technology, Institute of Science Tokyo, 4259 Nagatsuta, Midori-ku, Yokohama 226-8501 Japan; Institute of Post-LED Photonics, Tokushima University, 2-1 Minami-Josanjima, Tokushima, 770-8506, Japan
Event-sparse stack denoising for 4D-STEM applications
AuthorsGregory Nordahl; Rebekka Klemmt; Martin Wibrand Larsen; Espen Drath Bøjesen
AffiliationsCenter for Sustainable Energy Materials (CENSEMAT), Aarhus University, DK-8000 Aarhus C, Denmark; Interdisciplinary Nanoscience Centre, Aarhus University, DK-8000 Aarhus C, Denmark
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