Paper Review Records
All Paper Review Records
24 valid samples · Newest publication first
Review days = acceptance date − received date. PDF, DOI, and publisher-page sources are retained.
387
days
Text Mining Based FMEA on Online Reviews With POStagging2vec
Authors
Sezen Ayber; Ahmet Aydın; Gökhan Göksel; Mustafa Ünver; Nihal ErginelShow moreShow less
Affiliations
1. Institute of Graduate Programs Eskişehir Technical University Eskişehir Turkey; 2. Computer Engineering Department Eskişehir Technical University Eskişehir Turkey; 3. Industrial Engineering Department Maltepe University İstanbul Turkey; 4. Industrial Engineering Department Eskişehir Technical University Eskişehir TurkeyShow moreShow less
76
days
Continuous Cascading Failures of Wireless Sensor Networks Under a Novel Sequential Attack Strategy
Authors
Liping Jiang; Bei Wu; Jianwu XueShow moreShow less
Affiliations
1. School of Management Northwestern Polytechnical University Xi'an ChinaShow moreShow less
89
days
Mixed Gamma Accelerated Degradation Model and Life Evaluation Considering Multi‐Subpopulation Heterogeneity
Authors
Haowei Wang; Shuohai Sang; Jinghua Liang; Yang LiShow moreShow less
Affiliations
1. Hangzhou International Innovation Institute Beihang University Hangzhou ChinaShow moreShow less
120
days
Multivariate Triple Sampling Hotelling's T2 Chart for Autocorrelated Processes
Authors
Selina Nargis; Michael B. C. Khoo; Dongmei Cui; Zhi Lin Chong; Oluwagbenga Tobi BabatundeShow moreShow less
Affiliations
1. School of Mathematical Sciences Universiti Sains Malaysia Penang Malaysia; 2. School of Business Hunan International Economics University Changsha Hunan China; 3. Department of Electronic Engineering Faculty of Engineering and Green Technology Universiti Tunku Abdul Rahman Kampar Perak Malaysia; 4. Department of Statistics University of Nigeria, Nsukka Enugu State NigeriaShow moreShow less
139
days
Research on the Reliability of NPC Three‐Level Inverter Based on Low Common‐Mode Voltage Modulation
Authors
Xiaohong Hao; Yao ZhangShow moreShow less
Affiliations
1. School of Mechanical and Electronical Engineering University of Electronic Science and Technology of China Chengdu Sichuan ChinaShow moreShow less
234
days
FAD‐Net: An Efficient Architecture for Defect Recognition in Semiconductor Wafers
Authors
Imran Khan Mirani; Naigong Yu; Malak Abid Ali KhanShow moreShow less
Affiliations
1. Faculty of Information Technology Beijing University of Technology Beijing China; 2. Beijing Key Laboratory of Computing Intelligence and Intelligent System Beijing University of Technology Beijing China; 3. Engineering Research Center of Digital Community Ministry of Education Beijing China; 4. Information System and Security Countermeasures Experimental Center School of Information and Electronics Beijing Institute of Technology Beijing ChinaShow moreShow less
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