Paper Review Records
All Paper Review Records
10 valid samples · Newest publication first
Review days = acceptance date − received date. PDF, DOI, and publisher-page sources are retained.
78
days
Silicon-based qubit technology: progress and future prospects
Authors
Wasi Uddin; Biswajit Khan; Sheetal Dewan; Samaresh DasShow moreShow less
Affiliations
1. Center for Applied Research in Electronics, Indian Institute of Technology Delhi, New Delhi, India; 2. School of Interdisciplinary Research, Indian Institute of Technology Delhi, New Delhi, IndiaShow moreShow less
156
days
Processability and performance property correlation for LDPE/PA6-based nanocomposite and its monolayer blown film for packaging application
Authors
Srijita Purkayastha; Anindya Dutta; Anup Kumar Ghosh; Narayan Chandra SahaShow moreShow less
Affiliations
1. Department of Materials Science and Engineering, Indian Institute of Technology Delhi, New Delhi, India; 2. Foundation for Innovative Packaging and Sustainability, Mumbai, IndiaShow moreShow less
107
days
Fabrication, characterization and photocatalytic degradation activity of PS/PANI/CeO 2 tri-layer nanostructured hybrids
Authors
Yue Chen; Tianyu Wang; Jie Pan; Menghan Wang; Ailian Chen; Yang ChenShow moreShow less
Affiliations
1. School of Materials Science and Engineering, Changzhou University, Jiangsu, People’s Republic of China; 2. School of Mechanical Engineering, Changzhou University, Jiangsu, People’s Republic of ChinaShow moreShow less
111
days
Electromagnetic shielding efficiency of carbon fibre fabric-sandwiched epoxy–MWCNT nanocomposites
Authors
Abhishek Sharma; Myneni Sukesh Babu; Asapu Vinaya Kumar; R Sarathi; V SubramanianShow moreShow less
Affiliations
1. Department of Electrical Engineering, Indian Institute of Technology Madras, Chennai, India; 2. Microwave Laboratory, Department of Physics, Indian Institute of Technology Madras, Chennai, IndiaShow moreShow less
Expert Matching · Case Demo
Turn Your Submission Goalsinto a Verifiable Journal Plan
Share your field, deadline, and author profile. CrushSCI uses real review records to suggest a title direction, shortlist journals, and estimate timelines.
