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NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
Paper Review Records
All Paper Review Records
18 valid samples · Newest publication first
Review days = acceptance date − received date. PDF, DOI, and publisher-page sources are retained.
88
days
Total ionizing dose effects on front-end electronics with impedance spectroscopy
AuthorsPierluigi Casolaro; Vincenzo Izzo; Riccardo Vari; Antonio Marzullo; Claudio Principe; Antonio Vanzanella; Paolo Di Meo; Antonio Anastasio; Arbab Imtiaz; Alberto Aloisio
AffiliationsDepartment of Physics “Ettore Pancini”, Università degli Studi di Napoli Federico II, Complesso Univ. Monte S. Angelo, Napoli, I-80126, Italy; INFN Sezione di Napoli, Complesso Univ. Monte S. Angelo, Napoli, I-80126, Italy; INFN Sezione di Roma, Piazzale Aldo Moro, Roma, I-00185, Italy; Dipartimento di Fisica e Astronomia G. Galilei, Università degli Studi di Padova, Via F. Marzolo 8, Padova, IT-35131, Italy
40
days
The CGEM-IT of the BESIII detector
AuthorsA. Amoroso
AffiliationsDepartment of Physics, Univ. of Torino, Via P. Giuria 1, Torino, 10125, Italy; INFN Torino, Via P.Giuria, 1, Torino, 10125, Italy
94
days
A Heavy Ion Monitor on a Chip based on a non-volatile memory architecture — Part II: Device characterization & modeling
AuthorsDale Julson; Mike Youngs; Hannah Lowrey; David Keltner; Tim Hossain; Clayton Fullwood
AffiliationsCerium Laboratories, Austin, TX, 78741, USA; Texas A&M University Cyclotron Institute, College Station, TX 77843, USA; Department of Physics, University of Dallas, Irving, TX 75062, USA; Department of Physics and Astronomy, University of Missouri-Kansas City, Kansas City, MO 64110, USA
77
days
Upgrade of the GRAPES-3 experiment
AuthorsPravata K. Mohanty
AffiliationsTata Institute of Fundamental Research, Homi Bhabha Road, Colaba, Mumbai, 400005, Maharashtra, India
76
days
Assembly procedure of silicon strip detector module with 1μm alignment precision for the muon g-2/EDM experiment at J-PARC
AuthorsS. Ogawa; R. Azuma; K. Awa; Y. Okazaki; T. Kishishita; T. Kume; N. Saito; M. Sakakibara; O. Sasaki; T. Sato; Y. Sato; M. Shoji; S. Shirabe; T. Suehara; J. Suzuki; T. Suda; Y. Seino; H. Sendai; T. Takatomi; M. Tanaka; S. Doi; J. Tojo; S. Fukumura; Y. Fujita; Y. Honda; R. Honda; T. Mibe; Y. Murata; H. Yamaoka; T. Yamanaka; T. Yoshioka
AffiliationsHigh Energy Accelerator Research Organization (KEK), 1-1 Oho, Tsukuba, 305-0801, Ibaraki, Japan; Kyushu University, 744 Motooka, Nishi-ku, Fukuoka, 819-0395, Japan; Tohoku University, 6-6 Aramaki, Aoba-ku, Sendai, 980-8579, Miyagi, Japan; Niigata University, 8050 Ikarashi 2-no-cho, Nishi-ku, Niigata, 950-2181, Japan; National Institute of Technology, Toyama College, Imizu, Toyama, 933-0293, Japan; The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo, 113-8654, Japan; University of Bonn, Regina-Pacis-Weg 3, Bonn, 53113, Germany
210
days
Local performance and stability analysis of pad spacer Multi-gap Resistive Plate Chambers for the Compressed Baryonic Matter Time-Of-Flight system under high-rate irradiation
AuthorsKai Sun; Suhong Wei; Shihao Zhang; Daming Liu; Yi Wang
AffiliationsDepartment of Engineering Physics, Tsinghua University, Beijing, 100084, China
91
days
A microfluidic in situ SAXS method for concentration-series measurements of protein solutions from a limited sample volume
AuthorsV.Yu. Svechnikova; P.V. Konarev; G.S. Peters; D.Yu. Molodtsov; V.A. Shishkov; M.A. Marchenkova
AffiliationsNational Research Centre «Kurchatov Institute», 1, Akademika Kurchatova pl., Moscow, 123182, Russia; The Smart Materials Research Institute, Southern Federal University, 178/124, Andreya Sladkova St., Rostov-on-Don, 344090, Russia
323
days
Radiation damage study of Belle II silicon strip sensors with 90 MeV electron irradiation
AuthorsK. Adamczyk; H. Aihara; K. Amos; S. Bacher; S. Bahinipati; J. Baudot; P.K. Behera; S. Bettarini; L. Bosisio; A. Bozek; F. Buchsteiner; G. Casarosa; C. Cheshta; L. Corona; S.B. Das; G. Dujany; C. Finck; F. Forti; M. Friedl; A. Gabrielli; V. Gautam; B. Gobbo; K. Hara; T. Higuchi; C. Irmler; A. Ishikawa; M. Kaleta; A.B. Kaliyar; K.H. Kang; R. Kumar; K. Lalwani; J. Libby; V. Lisovskyi; L. Massaccesi; G.B. Mohanty; S. Mondal; K.R. Nakamura; Z. Natkaniec; Y. Onuki; F. Otani; A. Paladino; V. Raj; K. Ravindran; J.U. Rehman; I. Ripp-Baudot; G. Rizzo; Y. Sato; C. Schwanda; J. Serrano; T. Shimasaki; S. Tanaka; R. Thalmeier; T. Tsuboyama; Y. Uematsu; L. Vitale; S.J. Wang; Z. Wang; J. Wiechczynski; H. Yin; L. Zani; F. Zeng
AffiliationsInstitute of High Energy Physics, Austrian Academy of Sciences, 1050 Vienna, Austria; Aix Marseille Univ, CNRS/IN2P3, CPPM, Marseille, France; IPHC, UMR 7178, Université de Strasbourg, CNRS, 67037 Strasbourg, France; Indian Institute of Technology Bhubaneswar, Bhubaneswar 752050, India; Indian Institute of Technology Madras, Chennai 600036, India; Malaviya National Institute of Technology Jaipur, Jaipur 302017, India; Punjab Agricultural University, Ludhiana 141004, India; Tata Institute of Fundamental Research, Mumbai 400005, India; Dipartimento di Fisica, Università di Pisa, I-56127 Pisa, Italy; INFN Sezione di Pisa, I-56127 Pisa, Italy; INFN Sezione di Torino, I-10125 Torino, Italy; INFN Sezione di Bologna, I-40127 Bologna, Italy; Dipartimento di Fisica, Università di Trieste, I-34127 Trieste, Italy; INFN Sezione di Trieste, I-34127 Trieste, Italy; The Graduate University for Advanced Studies (SOKENDAI), Hayama 240-0193, Japan; Kavli Institute for the Physics and Mathematics of the Universe, University of Tokyo, Kashiwa 277-8583, Japan; Department of Physics, University of Tokyo, Tokyo 113-0033, Japan; High Energy Accelerator Research Organization (KEK), Tsukuba 305-0801, Japan; H. Niewodniczanski Institute of Nuclear Physics, Krakow 31-342, Poland; INFN Sezione di Roma Tre, I-00185 Roma, Italy; Department of Physics, Kyungpook National University, Daegu 41566, Republic of Korea; Dr. B.R. Ambedkar National Institute of Technology, Jalandhar, Punjab 144008, India
106
days
Monolithic integration of cooling microchannels in silicon wafers with CMOS Back-End-of-Line layers
AuthorsJavier Fernández-Tejero; André Dias; Marta Duch; Roser Mas; Miguel Ullán
AffiliationsCentro Nacional de Microelectrónica (IMB-CNM, CSIC), Campus UAB-Bellaterra, 08193 Barcelona, Spain
126
days
Development of pixelated Capacitive-Coupled LGAD (ACLGADpix) detectors
AuthorsKoji Nakamura; Yua Murayama; Issei Horikoshi; Mahiro Kobayashi; Koji Sato
AffiliationsHigh Energy Accelerator Research Organization (KEK), Oho 1-1, Tsukuba, 305-0801, Ibaraki, Japan; University of Tsukuba, Tennodai 1-1-1, Tsukuba, 305-8571, Ibaraki, Japan
Expert Matching · Case Demo
Turn Your Submission Goalsinto a Verifiable Journal Plan
Share your field, deadline, and author profile. CrushSCI uses real review records to suggest a title direction, shortlist journals, and estimate timelines.
Client
I work in environmental engineering and need an SCI paper published within three months. I have no grant funding or prominent co-author. Which journals could I target?
CrushSCI
Yes. We will first screen for feasibility against the 90-day deadline, then identify comparable papers without grant support or prominent co-authors. The final shortlist will prioritize research quality and journal scope.
- Suggested title
- Machine Learning and Life-Cycle Assessment for Predicting and Optimizing Carbon Emissions in Urban Wastewater Treatment
- Database shortlist
- Environmental Technology & Innovation
SampleLatest 5 valid paper samples from 2026
Average review96.4 days
Median77 days