Paper Review Records
All Paper Review Records
10 valid samples · Newest publication first
Review days = acceptance date − received date. PDF, DOI, and publisher-page sources are retained.
86
days
Mitigating Plasma Etch-Induced Negative Charge Trapping in 2.7 kV β‑Ga2O3 (001) Trench Schottky Barrier Diodes Using H3PO4 Treatment
Authors
Min-Yeong Kim; Aditya Kundapura Bhat; Sai Charan Vanjari; Matthew D. Smith; Martin KuballShow moreShow less
Affiliations
1. Center for Device Thermography and Reliability (CDTR), 1980University of Bristol, Bristol BS8 1TL, U.K.; 2. Innovation and Knowledge Centre REWIRE, 1980University of Bristol, Bristol BS8 1TL, U.K.Show moreShow less
77
days
ALD-Derived WO3–x Leads to Nearly Wake-Up-Free Ferroelectric Hf0.5Zr0.5O2 at Elevated Temperatures
Authors
Nashrah Afroze; Jihoon Choi; Salma Soliman; Chang Hoon Kim; Jiayi Chen; Yu-Hsin Kuo; Mengkun Tian; Chengyang Zhang; Priyankka Gundlapudi Ravikumar; Suman Datta; Andrea Padovani; Jun Hee Lee; Asif KhanShow moreShow less
Affiliations
1. Department of Electrical and Computer Engineering, 1438Georgia Institute of Technology, Atlanta, Georgia 30332, United States; 2. School of Energy and Chemical Engineering, 131639Ulsan National Institute of Science and Technology (UNIST), Ulsan 44919, South Korea; 3. Institute of Materials and Systems, 115724Georgia Institute of Technology, Atlanta, Georgia 30332, United States; 4. Department of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332, United States; 5. Department of Engineering Sciences and Methods (DISMI), University of Modena and Reggio Emilia, Reggio Emilia 42122, Italy; 6. Graduate School of Semiconductor Materials and Devices Engineering, 9306Ulsan National Institute of Science and Technology (UNIST), Ulsan 44919, South KoreaShow moreShow less
141
days
Phase-Coherent Transport in Two-Dimensional Tellurium Flakes
Authors
Mohammad Hafijur Rahaman; Nathan Tanner Sawyers; Mourad Benamara; Trudie Culverhouse; Gokul Acharya; Durga Venkata Maheswar Repaka; Qiyuan He; Hugh O. H. Churchill; Dharmraj Kotekar-PatilShow moreShow less
Affiliations
1. Department of Physics, 3341University of Arkansas, Fayetteville, Arkansas 72701, United States; 2. Institute for Nano Science and Engineering, University of Arkansas, Fayetteville, Arkansas 72701, United States; 3. Institute of Materials Research and Engineering, 208718Agency for Science Technology and Research, (A*STAR) Singapore 138634, Republic of Singapore; 4. Department of Chemistry, School of Natural Sciences, University of Manchester, Manchester M13 9PL, United Kingdom; 5. Department of Materials Science and Engineering, 121844City University of Hong Kong, 83 Tat Chee Avenue, Kowloon, Hong Kong 999077, China; 6. MonArk NSF Quantum Foundry, University of Arkansas, Fayetteville, Arkansas 72701 United StatesShow moreShow less
72
days
Real-Time TEM Observation of the Microstructural Evolution in Silver Nanowires under Heating and Electrical Biasing
Authors
Katarzyna Bejtka; Marco Allione; Carlo Ricciardi; Candido Fabrizio Pirri; Gianluca MilanoShow moreShow less
Affiliations
1. Department of Applied Science and Technology, 19032Politecnico di Torino, 10129 Torino, Italy; 2. Center for Sustainable Future Technologies, Istituto Italiano di Tecnologia, 10144 Torino, Italy; 3. Advanced Materials Metrology and Life Sciences, INRiM Istituto Nazionale di Ricerca Metrologica, 10135 Torino, ItalyShow moreShow less
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