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Suppressing Hexagonal Defects in Ex Situ Remote Plasma Dry Etch Processing
作者Kangjian Cheng; Jingyan Huang; Wen Siang Lew
作者单位1. School of Physical and Mathematical Sciences, Nanyang Technological University, Jurong West, Singapore; 2. GlobalFoundries Singapore Pte. Ltd., Jurong West, Singapore
Bipolar Transistor Test Structures for Extracting Minority Carrier Lifetime in IGBTs
作者Kiyoshi Takeuchi; Munetoshi Fukui; Takuya Saraya; Kazuo Itou; Toshihiko Takakura; Shinichi Suzuki; Yohichiroh Numasawa; Naoyuki Shigyo; Kuniyuki Kakushima; Takuya Hoshii; Kazuyoshi Furukawa; Masahiro Watanabe; Hitoshi Wakabayashi; Kazuo Tsutsui; Hiroshi Iwai; Atsushi Ogura; Wataru Saito; Shin-Ichi Nishizawa; Masanori Tsukuda; Ichiro Omura; Hiromichi Ohashi; Toshiro Hiramoto
作者单位1. Institute of Industrial Science, The University of Tokyo; 2. Meiji University; 3. Tokyo Institute of Technology; 4. Research Institute for Applied Mechanics, Kyushu University; 5. Kyushu Institute of Technology
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