Paper Review Records
全部论文审稿周期
22 篇有效样本 · 按发表日期由新到旧排列
审稿天数=录用日期-收稿日期;保留 PDF/DOI/网页源链接
22
天
84
天
95
天
204
天
Image forgery detection and localization using deep learning techniques
作者
Shivam Sharma; Devshri Satyarthi; Santosh Singh Rathore; Binod Prasad展开收起
作者单位
1. Department of Information Technology ABV‐IIITM Gwalior Gwalior India; 2. Department of Computer Science and Engineering ABV‐IIITM Gwalior Gwalior India; 3. Department of Electrical and Electronics Engineering ABV‐IIITM Gwalior Gwalior India展开收起
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